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Laue-grams are the easiest x-ray diffraction patterns that can be obtained and are useful to orient single crystals and find out the symmetry of a projection. However, the orientation work is a costly and time consuming process. It would be a great advantage to be able to simulate any kind of Laue-gram and to identify an unknown crystal orientation, including anysotropic ones. This book presents the numerical algorithms for simulation of x-ray back-reflection Laue-grams, by evaluating the main factors that affect the intensities of the Laue-gram spots. To demonstrate the potential of the computational procedures developed, an example of every crystal system is shown. A PC diskette goes with the book, to be used for simulation and indexing of any back-reflection Laue pattern.